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Current issues:
January 23, 2026
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Next Orientation Lecture
: Monday, February 9, at 10:00 in room 488 - Contact
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Metrology
FILMETRIX F40: Thin film thickness measurement system
Nikon microscopes with CCD camera
ZEISS: Microscope with CCD camera
DEKTAK XT: Profilometer with 3D capability and imaging
EverBeing SR-4, Four-Point Probe
EasyScan 2 AFM: Atomic Force Microscope
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